High-Temperature Operating Life (HTOL)
HTOL Chamber
High-Temperature Operating Life Test Chamber
Our HTOL (High-Temperature Operating Life) Chamber is designed for long-duration semiconductor reliability testing under elevated temperature and operating electrical stress.
It is suitable for ICs, automotive electronics, memory devices, power semiconductors, SiC and GaN devices, supporting qualification, reliability verification and accelerated life testing.
Key Features
- Stable high-temperature operation for extended testing
- High temperature uniformity for consistent DUT conditions
- Customizable DUT racks, fixtures and electrical feedthroughs
- Multiple DUT capacity for high-throughput testing
- Continuous temperature monitoring and data logging
- Over-temperature, fan failure and other safety protection
- Optional power supply, data acquisition and test automation integration
The system can be configured to support JEDEC JESD22-A108, AEC-Q100, AEC-Q101 and customer-specific HTOL requirements.
We provide the chamber, DUT fixtures, electrical integration, monitoring and automation as a complete HTOL reliability test solution.
