High Temperature High Humidity Reverse Bias (H3TRB)

H3TRB Test System

High Temperature High Humidity Reverse Bias Testing

Our H3TRB (High Temperature High Humidity Reverse Bias) Test System combines a customized electrical tester with a BIA Climatic environmental chamber to evaluate semiconductor devices under simultaneous temperature, humidity and reverse-bias stress.

The system is suitable for power semiconductors, SiC and GaN devices, automotive electronics and other reliability-critical components where moisture resistance and electrical reliability are important.

Key Features

• Customized H3TRB electrical tester
• Integrated BIA Climatic temperature & humidity chamber
• Programmable temperature, humidity and reverse-bias conditions
• Customized DUT fixtures and electrical connections
• Multiple DUT testing for higher throughput
• Continuous temperature, humidity and electrical monitoring
• Data logging and test report generation
• Automatic test sequence and alarm protection
• Optional remote monitoring and test automation

 

Typical Applications

• SiC and GaN power semiconductor testing
• MOSFET, IGBT and diode reliability testing
• Automotive semiconductor qualification
• Power module reliability testing
• Semiconductor R&D and qualification laboratories

 

Complete H3TRB Solution

We provide the customized H3TRB tester, BIA Climatic chamber, DUT fixtures, electrical integration, monitoring and software as one complete reliability test system.

We can configure the system according to your required temperature, humidity, bias voltage, DUT quantity, test duration and test method.

Contact us to discuss your H3TRB testing requirements.